I On /I Off ratio comparison of this work with literature
SS and DIBL comparison of this work with reports in literature
TM DSG SiNT MOSFET with a inner gate and outer gate are shown with
Anil VOHRA, Professor (Full), M.Sc., Ph.D
Effect of 3 nm gate length scaling in junctionless double
SS and DIBL comparison of this work with reports in literature
Anil VOHRA, Professor (Full), M.Sc., Ph.D
TM DSG SiNT MOSFET with a inner gate and outer gate are shown with
I-V curves for Non-graded base SiGe HBT
ION/IOFF ratio comparison of this work with reports in literature
Photo-generation Rate generated in the model.
Subband profile along the device length (left), and current